Authors:
Katsidis, CC
Siapkas, DI
Robinson, AK
Hemment, PLF
Citation: Cc. Katsidis et al., Formation of conducting and insulating layered structures in Si by ion implantation - Process control using FTIR spectroscopy, J ELCHEM SO, 148(12), 2001, pp. G704-G716
Authors:
Terzidis, D
Mitsas, CL
Hatzikraniotis, E
Papadopoulos, I
Zorba, T
Moumouzias, G
Siapkas, DI
Kokkou, S
Citation: D. Terzidis et al., Optimizing carbon/LiMn2O4 rechargeable Li-ion cells: the effect of electrode fabrication and mass balance on cell performance, SOL ST ION, 135(1-4), 2000, pp. 297-304
Citation: N. Hatzopoulos et al., Double SIMOX structures formed by sequential high energy oxygen implantation into silicon, J ELCHEM SO, 147(1), 2000, pp. 354-362
Authors:
Mitsas, CL
Polychroniadis, EK
Siapkas, DI
Citation: Cl. Mitsas et al., Characterization of the interfacial region of epitaxial TlBiSe2 thin filmsby infrared spectroscopy and transmission electron microscopy, THIN SOL FI, 353(1-2), 1999, pp. 85-92