Authors:
Picard, C
Brisset, C
Hoffman, A
Charles, JP
Joffre, F
Adams, L
Siedle, AH
Citation: C. Picard et al., Use of electrical stress and isochronal annealing on power mosfets in order to characterize the effects of Co-60 irradiation., MICROEL REL, 40(8-10), 2000, pp. 1647-1652