Authors: Picard, C Brisset, C Hoffman, A Charles, JP Joffre, F Adams, L Siedle, AH

Citation: C. Picard et al., Use of electrical stress and isochronal annealing on power mosfets in order to characterize the effects of Co-60 irradiation., MICROEL REL, 40(8-10), 2000, pp. 1647-1652