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Results: 1-15 |
Results: 15
Optical methods in non-destructive testing
Authors: Sirohi, RS
Citation: Rs. Sirohi, Optical methods in non-destructive testing, INSIGHT, 43(4), 2001, pp. 230-234
Observation of self-diffraction effect in Acid blue 7 dye soaked gelatin films
Authors: Mangaiyarkarasi, D Palanisamy, PK Sirohi, RS
Citation: D. Mangaiyarkarasi et al., Observation of self-diffraction effect in Acid blue 7 dye soaked gelatin films, J MOD OPT, 48(6), 2001, pp. 947-958
Analysis of spectrally resolved white light interferograms: use of a phaseshifting technique
Authors: Helen, SS Kothiyal, MP Sirohi, RS
Citation: Ss. Helen et al., Analysis of spectrally resolved white light interferograms: use of a phaseshifting technique, OPT ENG, 40(7), 2001, pp. 1329-1336
Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities (vol 11, pg 315, 2000)
Authors: Udupa, G Singaperumal, M Sirohi, RS Kothiyal, MP
Citation: G. Udupa et al., Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities (vol 11, pg 315, 2000), MEAS SCI T, 11(5), 2000, pp. 585-585
Characterization of surface topography by confocal microscopy: I. Principles and the measurement system
Authors: Udupa, G Singaperumal, M Sirohi, RS Kothiyal, MP
Citation: G. Udupa et al., Characterization of surface topography by confocal microscopy: I. Principles and the measurement system, MEAS SCI T, 11(3), 2000, pp. 305-314
Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities
Authors: Udupa, G Singaperumal, M Sirohi, RS Kothiyal, MP
Citation: G. Udupa et al., Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities, MEAS SCI T, 11(3), 2000, pp. 315-329
White-light interferometry with polarization phase-shifter at the input ofthe interferometer
Authors: Helen, SS Kothiyal, MP Sirohi, RS
Citation: Ss. Helen et al., White-light interferometry with polarization phase-shifter at the input ofthe interferometer, J MOD OPT, 47(6), 2000, pp. 1137-1145
Eosin dye soaked gelatin as a recording medium
Authors: Mangaiyarkarasi, D Palanisamy, PK Sirohi, RS
Citation: D. Mangaiyarkarasi et al., Eosin dye soaked gelatin as a recording medium, OPT ENG, 39(8), 2000, pp. 2138-2142
Parametric study of photorefractive beam coupling in BaTiO3 at multiple wavelengths
Authors: Ara, MHM Vijayan, C Mohan, NK Sirohi, RS
Citation: Mhm. Ara et al., Parametric study of photorefractive beam coupling in BaTiO3 at multiple wavelengths, OPT ENG, 39(2), 2000, pp. 535-540
Phase shifting by a rotating polarizer in white-light interferometry for surface profiling
Authors: Helen, SS Kothiyal, MP Sirohi, RS
Citation: Ss. Helen et al., Phase shifting by a rotating polarizer in white-light interferometry for surface profiling, J MOD OPT, 46(6), 1999, pp. 993-1001
Nondestructive assessment of thinning of plates using digital shearography
Authors: Sirohi, RS Tay, CJ Shang, HM Boo, WP
Citation: Rs. Sirohi et al., Nondestructive assessment of thinning of plates using digital shearography, OPT ENG, 38(9), 1999, pp. 1582-1585
Estimation of diffraction efficiency of holographic gratings in photorefractive BaTiO3 and BaTiO3 : Ce at multiple wavelengths
Authors: Ara, MHM Vijayan, C Mohan, NK Sirohi, RS
Citation: Mhm. Ara et al., Estimation of diffraction efficiency of holographic gratings in photorefractive BaTiO3 and BaTiO3 : Ce at multiple wavelengths, OPTIK, 110(8), 1999, pp. 383-388
Optical perfect shuffle using diffractive optical elements
Authors: Bhattacharya, S Wang, LL Sirohi, RS Tschudi, T
Citation: S. Bhattacharya et al., Optical perfect shuffle using diffractive optical elements, OPTIK, 110(5), 1999, pp. 233-237
A modified in-line speckle interferometric configuration for contouring ofthree-dimensional objects
Authors: Santhanakrishnan, T Mohan, NK Palanisamy, PK Sirohi, RS
Citation: T. Santhanakrishnan et al., A modified in-line speckle interferometric configuration for contouring ofthree-dimensional objects, OPTIK, 110(4), 1999, pp. 181-183
Curvature measurement using double shear TV holography
Authors: Murukeshan, VM Ganesan, AR Sirohi, RS
Citation: Vm. Murukeshan et al., Curvature measurement using double shear TV holography, OPTIK, 110(2), 1999, pp. 57-60
Risultati: 1-15 |