Authors:
Skromme, BJ
Luckowski, E
Moore, K
Bhatnagar, M
Weitzel, CE
Gehoski, T
Ganser, D
Citation: Bj. Skromme et al., Electrical characteristics of schottky barriers on 4H-SiC: The effects of barrier height nonuniformity, J ELEC MAT, 29(3), 2000, pp. 376-383
Authors:
Skromme, BJ
Jayapalan, J
Vaudo, RP
Phanse, VM
Citation: Bj. Skromme et al., Low-temperature luminescence of exciton and defect states in heteroepitaxial GaN grown by hydride vapor phase epitaxy, APPL PHYS L, 74(16), 1999, pp. 2358-2360
Authors:
Jayapalan, J
Skromme, BJ
Vaudo, RP
Phanse, VM
Citation: J. Jayapalan et al., Optical spectroscopy of Si-related donor and acceptor levels in Si-doped GaN grown by hydride vapor phase epitaxy, APPL PHYS L, 73(9), 1998, pp. 1188-1190