Authors:
Sonnichsen, C
Geier, S
Hecker, NE
von Plessen, G
Feldmann, J
Ditlbacher, H
Lamprecht, B
Krenn, JR
Aussenegg, FR
Chan, VZH
Spatz, JP
Moller, M
Citation: C. Sonnichsen et al., Spectroscopy of single metallic nanoparticles using total internal reflection microscopy, APPL PHYS L, 77(19), 2000, pp. 2949-2951