Authors: Sonsky, J Hollander, RW van Eijk, CWE Sarro, PM Kouchpil, V

Citation: J. Sonsky et al., Multi-anode sawtooth SDD for X-ray spectroscopy fabricated on NTD wafers, IEEE NUCL S, 48(3), 2001, pp. 258-261

Authors: Sonsky, J Valk, H Huizenga, J Hollander, RW van Eijk, CWE Sarro, PM

Citation: J. Sonsky et al., Silicon drift detector with reduced lateral diffusion: experimental results, NUCL INST A, 439(2-3), 2000, pp. 513-518

Authors: Sonsky, J Huizenga, J Hollander, RW van Eijk, CWE Sarro, PM

Citation: J. Sonsky et al., X-ray detection with multi-anode sawtooth silicon drift detectors, IEEE NUCL S, 47(3), 2000, pp. 750-755

Authors: Sonsky, J Valk, H Huizenga, J Hollander, RW van Eijk, CWE Sarro, PM

Citation: J. Sonsky et al., Electron confinement in multi-anode saw tooth silicon drift detectors withan anode pitch of 250 mu m, IEEE NUCL S, 46(3), 1999, pp. 271-274

Authors: Sonsky, J Valk, H Allier, CP Hollander, RW van Eijk, CWE Sarro, PM

Citation: J. Sonsky et al., Diminished electron cloud broadening in a silicon drift detector by sawtooth p(+) strips, IEEE NUCL S, 46(1), 1999, pp. 53-58