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Results: 1-13 |
Results: 13

Authors: Bykov, IP Glinchuk, MD Laguta, VV Slipenyuk, AM Soukup, L Jastrabik, L Hrabovsky, M
Citation: Ip. Bykov et al., ESR investigation of ferroelectric films, INTEGR FERR, 32(1-4), 2001, pp. 851-859

Authors: Fuchino, S Geschke, S Soukup, L
Citation: S. Fuchino et al., On the weak Freese-Nation property of P(omega), ARCH MATH L, 40(6), 2001, pp. 425-435

Authors: Hubicka, Z Sicha, M Pajasova, L Soukup, L Jastrabik, L Chvostova, D Wagner, T
Citation: Z. Hubicka et al., CNx coatings deposited by pulsed RF supersonic plasma jet: hardness, nitrogenation and optical properties, SURF COAT, 142, 2001, pp. 681-687

Authors: Fuchino, S Geschke, S Shelah, S Soukup, L
Citation: S. Fuchino et al., On the weak Freese-Nation property of complete Boolean algebras, ANN PUR APP, 110(1-3), 2001, pp. 89-105

Authors: Kulikovsky, V Shaginyan, L Jastrabik, L Soukup, L Bohac, P Musil, J
Citation: V. Kulikovsky et al., Some growth peculiarities of a-C : H films in ECR microwave plasma, VACUUM, 60(3), 2001, pp. 315-323

Authors: Jastrabik, L Soukup, L Shaginyan, LR Onoprienko, AA
Citation: L. Jastrabik et al., Deposition conditions and composition and structure relationships for nitride carbon films obtained by ECR plasma-assisted CVD and reactive rf magnetron sputtering, SURF COAT, 123(2-3), 2000, pp. 261-267

Authors: Bykov, IP Glinchuk, MD Laguta, VV Slipenyuk, AM Korniyenko, SM Soukup, L Jastrabik, L Dejneka, A
Citation: Ip. Bykov et al., Defects and impurities in SrTiO3 films: Evidence from ESR, FERROELECTR, 239(1-4), 2000, pp. 1219-1226

Authors: Fendrych, F Pajasova, L Wagner, T Jastrabik, L Chvostova, D Soukup, L Rusnak, K
Citation: F. Fendrych et al., CNx coatings sputtered by DC magnetron: hardness, nitrogenation and optical properties, DIAM RELAT, 8(8-9), 1999, pp. 1711-1714

Authors: Fendrych, F Soukup, L Jastrabik, L Sicha, M Hubicka, Z Chvostova, D Tarasenko, A Studnicka, V Wagner, T
Citation: F. Fendrych et al., Cu3N films prepared by the low-pressure r.f. supersonic plasma jet reactor: Structure and optical properties, DIAM RELAT, 8(8-9), 1999, pp. 1715-1719

Authors: Shaginyan, LR Fendrych, F Jastrabik, L Soukup, L Kulikovsky, VY Musil, J
Citation: Lr. Shaginyan et al., CNxHy films obtained by ECR plasma activated CVD: The role of substrate bias (DC, RF) and some other deposition parameters in growth mechanisms, SURF COAT, 119, 1999, pp. 65-73

Authors: Soukup, L Sicha, M Fendrych, F Jastrabik, L Hubicka, Z Chvostova, D Sichova, H Valvoda, V Tarasenko, A Studnicka, V Wagner, T Novak, M
Citation: L. Soukup et al., Copper nitride thin films prepared by the RF plasma chemical reactor with low pressure supersonic single and multi-plasma jet system, SURF COAT, 119, 1999, pp. 321-326

Authors: Adamek, P Kalcik, J Sicha, M Tichy, M Biederman, H Soukup, L Jastrabik, L
Citation: P. Adamek et al., Contribution to the application of the Langmuir probe technique for plasmamonitoring in the Ar and n-hexane mixture plasma during the polymerisationprocess, CZEC J PHYS, 49(12), 1999, pp. 1685-1701

Authors: Soukup, L
Citation: L. Soukup, Probability distribution of transformed random variables with application to nonlinear feature extraction, KYBERNETIKA, 34(4), 1998, pp. 473-478
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