Authors: Nikulin, AY Siu, K Davis, JR Zaumseil, P Souvorov, AY Freund, A

Citation: Ay. Nikulin et al., Application of the phase-retrieval x-ray diffractometry to an ultra-high spatial resolution mapping of SiGe films near the absorption edge of Ge, PHYS ST S-A, 184(1), 2001, pp. 145-155

Authors: Nikulin, AY Davis, JR Jones, NT Usher, BF Souvorov, AY Freund, A

Citation: Ay. Nikulin et al., Experimental observation of X-ray diffraction from a thin crystalline filmat a 90 degrees Bragg reflection, PHYS ST S-A, 179(1), 2000, pp. 103-108