Authors:
Jeong, KJ
Choi, SH
Cho, TY
Chun, HG
Spoutai, S
Citation: Kj. Jeong et al., The modeling of relationship between surface roughness and electrostatic force on electrostatic chuck, J KOR PHYS, 35, 1999, pp. S701-S707
Citation: S. Spoutai et al., New method for estimation of grain boundaries contribution to resistance of highly doped polysilicon, JPN J A P 1, 37(12B), 1998, pp. 6974-6976