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Results: 1-2 |
Results: 2
Ionization and displacement damage irradiation studies of quantum devices:Resonant tunneling diodes and two-dimensional electron gas transistors
Authors: Wilkins, R Shojah-Ardalan, S Kirk, WP Spencer, GF Bate, RT Seabaugh, AC Lake, R Stelmaszyk, P Wieck, AD Fogarty, TN
Citation: R. Wilkins et al., Ionization and displacement damage irradiation studies of quantum devices:Resonant tunneling diodes and two-dimensional electron gas transistors, IEEE NUCL S, 46(6), 1999, pp. 1702-1707
Study of the hot spot of an in-plane gate transistor by scanning Joule expansion microscopy
Authors: Bolte, J Niebisch, F Pelzl, J Stelmaszyk, P Wieck, AD
Citation: J. Bolte et al., Study of the hot spot of an in-plane gate transistor by scanning Joule expansion microscopy, J APPL PHYS, 84(12), 1998, pp. 6917-6922
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