Authors:
Nguyen, CV
Chao, KJ
Stevens, RMD
Delzeit, L
Cassell, A
Han, J
Meyyappan, M
Citation: Cv. Nguyen et al., Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors, NANOTECHNOL, 12(3), 2001, pp. 363-367