Authors: Stoger, M Schattschneider, P Schlosser, V Schneider, R Kirmse, H Neumann, W

Citation: M. Stoger et al., TEM and EELS microanalysis of pc-Si thin film solar cells deposited by means of HWCVD, SOL EN MAT, 70(1), 2001, pp. 39-47

Authors: Stoger, M Nelhiebel, M Schattschneider, P Schlosser, V Breymesser, A Jouffrey, B

Citation: M. Stoger et al., EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures, SOL EN MAT, 63(2), 2000, pp. 177-184

Authors: Stoger, M Breymesser, A Schlosser, V Ramadori, M Plunger, V Peiro, D Voz, C Bertomeu, J Nelhiebel, M Schattschneider, P Andreu, J

Citation: M. Stoger et al., Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD, PHYSICA B, 274, 1999, pp. 540-543