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Results:
1-7
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Results: 7
Authors:
Bilyalov, RR
Ludemann, R
Wettling, W
Stalmans, L
Poortmans, J
Nijs, J
Schirone, L
Sotgiu, G
Strehlke, S
Levy-Clement, C
Citation: Rr. Bilyalov et al., Multicrystalline silicon solar cells with porous silicon emitter, SOL EN MAT, 60(4), 2000, pp. 391-420
Authors:
Strehlke, S
Bastide, S
Guillet, J
Levy-Clement, C
Citation: S. Strehlke et al., Design of porous silicon antireflection coatings for silicon solar cells, MAT SCI E B, 69, 2000, pp. 81-86
Authors:
Strehlke, S
Bastide, S
Polgar, O
Fried, M",Levy-Clement
Citation: S. Strehlke et al., Characterization of thin porous silicon films formed on n(+)/p silicon junctions by spectroscopic ellipsometry, J ELCHEM SO, 147(2), 2000, pp. 636-641
Authors:
Strehlke, S
Bastide, S
Levy-Clement, C
Citation: S. Strehlke et al., Optimization of porous silicon reflectance for silicon photovoltaic cells, SOL EN MAT, 58(4), 1999, pp. 399-409
Authors:
Stalmans, L
Poortmans, J
Bender, H
Conard, T
Jin, S
Nijs, J
Mertens, R
Strehlke, S
Levy-Clement, C
Debarge, L
Slaoui, A
Citation: L. Stalmans et al., Low-thermal-budget treatments of porous silicon surface layers on crystalline Si solar cells: A way to go for improved surface passivation?, SOL EN MAT, 58(3), 1999, pp. 237-252
Authors:
Bastide, S
Albu-Yaron, A
Strehlke, S
Levy-Clement, C
Citation: S. Bastide et al., Formation and characterization of porous silicon layers for application inmulticrystalline silicon solar cells, SOL EN MAT, 57(4), 1999, pp. 393-417
Authors:
Fried, M
Polgar, O
Lohner, T
Strehlke, S
Levy-Clement, C
Citation: M. Fried et al., Comparative study of the oxidation of thin porous silicon layers studied by reflectometry, spectroscopic ellipsometry and secondary ion mass spectroscopy, J LUMINESC, 80(1-4), 1998, pp. 147-152
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