Authors:
Harutyunyan, VS
Aivazyan, AP
Weber, ER
Kim, Y
Park, Y
Subramanya, SG
Citation: Vs. Harutyunyan et al., High-resolution x-ray diffraction strain-stress analysis of GaN/sapphire heterostructures, J PHYS D, 34(10A), 2001, pp. A35-A39
Authors:
Perlin, P
Subramanya, SG
Mars, DE
Kruger, J
Shapiro, NA
Siegle, H
Weber, ER
Citation: P. Perlin et al., Pressure and temperature dependence of the absorption edge of a thick Ga0.92In0.08As0.985N0.015 layer, APPL PHYS L, 73(25), 1998, pp. 3703-3705