Authors: Suliman, SA Gollagunta, N Trabzon, L Hao, J Ridley, RS Knoedler, CM Dolny, GM Awadelkarim, OO Fonash, SJ

Citation: Sa. Suliman et al., The dependence of UMOSFET characteristics and reliability on geometry and processing, SEMIC SCI T, 16(6), 2001, pp. 447-454

Authors: Suliman, SA Awadelkarim, OO Fonash, SJ Dolny, GM Hao, J Ridley, RS Knoedler, CM

Citation: Sa. Suliman et al., The effects of channel boron-doping on the performance and hot electron reliability of N-channel trend UMOSFETs, SOL ST ELEC, 45(5), 2001, pp. 655-661