Authors:
Lehrer, C
Frey, L
Petersen, S
Sulzbach, T
Ohlsson, O
Dziomba, T
Danzebrink, HU
Ryssel, H
Citation: C. Lehrer et al., Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining, MICROEL ENG, 57-8, 2001, pp. 721-728
Authors:
Trenkler, T
Hantschel, T
Stephenson, R
De Wolf, P
Vandervorst, W
Hellemans, L
Malave, A
Buchel, D
Oesterschulze, E
Kulisch, W
Niedermann, P
Sulzbach, T
Ohlsson, O
Citation: T. Trenkler et al., Evaluating probes for "electrical" atomic force microscopy, J VAC SCI B, 18(1), 2000, pp. 418-427
Authors:
Dziomba, T
Sulzbach, T
Ohlsson, O
Lehrer, C
Frey, L
Danzebrink, HU
Citation: T. Dziomba et al., Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM), SURF INT AN, 27(5-6), 1999, pp. 486-490
Authors:
Danzebrink, HU
Dziomba, T
Sulzbach, T
Ohlsson, O
Lehrer, C
Frey, L
Citation: Hu. Danzebrink et al., Nano-slit probes for near-field optical microscopy fabricated by focused ion beams, J MICROSC O, 194, 1999, pp. 335-339