Authors: Rozenfeld, LB Suvorinov, AV

Citation: Lb. Rozenfeld et Av. Suvorinov, About some errors, arising during measurements of thin electron beams cross sizes, IAN FIZ, 64(8), 2000, pp. 1594-1600

Authors: Pakhomova, IY Suvorinov, AV Filipchuk, TS

Citation: Iy. Pakhomova et al., The influence of secondary electron analyzer retarding net on the voltage contrast detector resolution in scanning electron microscopes, IAN FIZ, 64(8), 2000, pp. 1629-1632