Authors: Mamor, M Willander, M Auret, FD Meyer, WE Sveinbjornsson, E

Citation: M. Mamor et al., Configurationally metastable defects in irradiated epitaxially grown boron-doped p-type Si - art. no. 045201, PHYS REV B, 6304(4), 2001, pp. 5201

Authors: Mamor, M Ouacha, H Willander, M Auret, FD Goodman, SA Ouacha, A Sveinbjornsson, E

Citation: M. Mamor et al., High-energy He-ion irradiation-induced defects and their influence on the noise behavior of Pd/n-Si1-xGex Schottky junctions, APPL PHYS L, 76(25), 2000, pp. 3750-3752

Authors: Rudenko, T Sveinbjornsson, E Sadeghi, M

Citation: T. Rudenko et al., A simple method for the evaluation of the recombination parameters in SiC MOS structures, MICROEL ENG, 48(1-4), 1999, pp. 273-276