Authors:
Svrcek, V
Pelant, I
Kocka, J
Fejfar, A
Tousek, J
Kondo, M
Matsuda, A
Citation: V. Svrcek et al., A new approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers, PHIL MAG L, 81(6), 2001, pp. 405-410
Authors:
Svrcek, V
Pelant, I
Stuchlik, J
Fejfar, A
Kocka, J
Citation: V. Svrcek et al., Detection of bottom depletion layer and its influence on surface photovoltage measurement in mu c-Si : H, THIN SOL FI, 383(1-2), 2001, pp. 271-273
Authors:
Svrcek, V
Pelant, I
Kocka, J
Fojtik, P
Rezek, B
Stuchlikova, H
Fejfar, A
Stuchlik, J
Poruba, A
Tousek, J
Citation: V. Svrcek et al., Transport anisotropy in microcrystalline silicon studied by measurement ofambipolar diffusion length, J APPL PHYS, 89(3), 2001, pp. 1800-1805
Authors:
Kocka, J
Stuchlik, J
Stuchlikova, H
Svrcek, V
Fojtik, P
Mates, T
Luterova, K
Fejfar, A
Citation: J. Kocka et al., Amorphous/microcrystalline silicon superlattices - the chance to control isotropy and other transport properties, APPL PHYS L, 79(16), 2001, pp. 2540-2542