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Citation: Jf. Ziegler et al., IBM EXPERIMENTS IN SOFT FAILS IN COMPUTER ELECTRONICS (1978-1994), IBM journal of research and development, 40(1), 1996, pp. 3-18

Authors: OGORMAN TJ ROSS JM TABER AH ZIEGLER JF MUHLFELD HP MONTROSE CJ CURTIS HW WALSH JL

Citation: Tj. Ogorman et al., FIELD TESTING FOR COSMIC-RAY SOFT ERRORS IN SEMICONDUCTOR MEMORIES, IBM journal of research and development, 40(1), 1996, pp. 41-50