Citation: Y. Beggah et al., CALCULATION OF THE ELECTRON-BEAM-INDUCED CURRENT AT THE INTERFACE OF A SCHOTTKY CONTACT IN THE PRESENCE OF SHOCKLEY-READ-HALL RECOMBINATION, Solid-state electronics, 42(3), 1998, pp. 379-383
Citation: N. Tabet et M. Ledra, MONTE-CARLO SIMULATION OF THE EBIC GRAIN-BOUNDARY CONTRAST IN SEMICONDUCTORS, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 181-184
Citation: S. Achour et al., CATHODOLUMINESCENCE DEPENDENCE UPON IRRADIATION TIME, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 289-292
Citation: Y. Beggah et al., ON THE EFFECT OF THE RECOMBINATION WITHIN THE DEPLETION ZONE ON THE EBIC SIGNAL AT SCHOTTKY CONTACT, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 101-104
Citation: S. Achour et al., CATHODOLUMINESCENCE DEPENDENCE ON ELECTRON-BEAM DIAMETER, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 141-143