AAAAAA

   
Results: 1-2 |
Results: 2
FAST, RELIABLE MECHANICAL PROBING OF SUBMICRON FEATURES A NEW TOOL THAT COMBINES GAS-ASSISTED FIB AND MECHANICAL PROBING
Authors: BROWN J DESILETS M MASNAGHETTI D TALBOT CG
Citation: J. Brown et al., FAST, RELIABLE MECHANICAL PROBING OF SUBMICRON FEATURES A NEW TOOL THAT COMBINES GAS-ASSISTED FIB AND MECHANICAL PROBING, Microelectronic engineering, 31(1-4), 1996, pp. 149-156
A NEW APPLICATION-SPECIFIC FIB SYSTEM ARCHITECTURE
Authors: TALBOT CG
Citation: Cg. Talbot, A NEW APPLICATION-SPECIFIC FIB SYSTEM ARCHITECTURE, Microelectronic engineering, 30(1-4), 1996, pp. 597-602
Risultati: 1-2 |