AAAAAA
Results: 26-50/54
Authors:
PAPE I
HASE TPA
TANNER BK
LAIDLER H
EMMERSON C
SHEN T
HICKEY BJ
Citation: I. Pape et al., GIANT MAGNETORESISTANCE AND INTERFACE STRUCTURE OF CU CO MULTILAYERS GROWN BY MBE ON SI(111) SUBSTRATES WITH COPPER-SILICIDE BUFFERS/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 373-374
Authors:
LAIDLER H
PAPE I
GREGORY CI
HICKEY BJ
TANNER BK
Citation: H. Laidler et al., X-RAY AND MAGNETORESISTANCE MEASUREMENTS OF ANNEALED CO CU MULTILAYERS/, Journal of magnetism and magnetic materials, 154(2), 1996, pp. 165-174
Authors:
MOCK P
TANNER BK
LI CR
KEIR AM
JOHNSON AD
LACEY G
CLARK GF
LUNN B
HOGG JCH
Citation: P. Mock et al., DETERMINATION OF THE CRITICAL THICKNESS OF MISFIT DISLOCATION MULTIPLICATION USING IN-SITU DOUBLE-CRYSTAL X-RAY-DIFFRACTION (VOL 11, PG 1051, 1996), Semiconductor science and technology, 11(9), 1996, pp. 1363-1363
Authors:
MOCK P
TANNER BK
LI CR
KEIR AM
JOHNSON AD
LACEY G
CLARK GF
LUNN B
HOGG JCH
Citation: P. Mock et al., DETERMINATION OF THE CRITICAL THICKNESS OF MISFIT DISLOCATION MULTIPLICATION USING IN-SITU DOUBLE-CRYSTAL X-RAY-DIFFRACTION, Semiconductor science and technology, 11(7), 1996, pp. 1051-1055
Authors:
NIEDOBA H
MIRECKI B
JACKSON M
JORDAN S
THOMPSON S
WHITING JSS
DJEMIA P
GANOT F
MOCH P
HASE TP
PAPE I
TANNER BK
Citation: H. Niedoba et al., MAGNETIZATION PROCESS AND MAGNETIC-PROPERTIES OF CO CR/CO TRILAYERS/, Physica status solidi. a, Applied research, 158(1), 1996, pp. 259-264
Authors:
TOBIN SP
TOWER JP
NORTON PW
CHANDLERHOROWITZ D
AMIRTHARAJ PM
LOPES VC
DUNCAN WM
SYLLAIOS AJ
ARD CK
GILES NC
LEE J
BALASUBRAMANIAN R
BOLLONG AB
STEINER TW
THEWALT MLW
BOWEN DK
TANNER BK
Citation: Sp. Tobin et al., A COMPARISON OF TECHNIQUES FOR NONDESTRUCTIVE COMPOSITION MEASUREMENTS IN CDZNTE SUBSTRATES, Journal of electronic materials, 24(5), 1995, pp. 697-705
Authors:
SAFA M
TANNER BK
Citation: M. Safa et Bk. Tanner, THE EFFECT OF CAPPING LAYERS ON LOW-ANGLE BRAGG PEAKS FROM COPPER-COBALT MULTILAYERS, Journal of magnetism and magnetic materials, 150(3), 1995, pp. 290-292
Authors:
COCKERTON S
TANNER BK
DERBYSHIRE G
Citation: S. Cockerton et al., A NOVEL HIGH DYNAMIC-RANGE X-RAY-DETECTOR FOR SYNCHROTRON-RADIATION STUDIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 97(1-4), 1995, pp. 561-566
Authors:
BANISTER AJ
BRICKLEBANK N
CLEGG W
ELSEGOOD MRJ
GREGORY CI
LAVENDER I
RAWSON JM
TANNER BK
Citation: Aj. Banister et al., THE FIRST SOLID-STATE PARAMAGNETIC 1,2,3,5-DITHIADIAZOLYL RADICAL - X-RAY CRYSTAL-STRUCTURE OF [P-NCC6F4CNSSN]CENTER-DOT, Journal of the Chemical Society, Chemical Communications, (6), 1995, pp. 679-680
Authors:
BARNETT SJ
KEIR AM
CULLIS AG
JOHNSON AD
JEFFERSON J
SMITH GW
MARTIN T
WHITEHOUSE CR
LACEY G
CLARK GF
TANNER BK
SPIRKL W
LUNN B
HOGG JCH
ASHU P
HAGSTON WE
CASTELLI CM
Citation: Sj. Barnett et al., IN-SITU X-RAY TOPOGRAPHY STUDIES DURING THE MOLECULAR-BEAM EPITAXY GROWTH OF INGAAS ON (001) GAAS - EFFECTS OF SUBSTRATE DISLOCATION DISTRIBUTION ON STRAIN RELAXATION, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 17-22
Authors:
HOLLAND AJ
TANNER BK
Citation: Aj. Holland et Bk. Tanner, SIMULATION OF X-RAY SECTION TOPOGRAPH IMAGES OF OXYGEN PRECIPITATES IN SILICON, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 27-32
Authors:
WHITEHOUSE CR
CULLIS AG
BARNETT SJ
USHER BF
CLARK GF
KEIR AM
TANNER BK
LUNN B
HOGG JCH
JOHNSON AD
LACEY G
SPIRKL W
HAGSTON WE
JEFFERSON JH
ASHU P
SMITH GW
Citation: Cr. Whitehouse et al., IN-SITU X-RAY-IMAGING OF III-V STRAINED-LAYER RELAXATION PROCESSES, Journal of crystal growth, 150(1-4), 1995, pp. 85-91
Authors:
HALLAM TD
OKTIK S
FUNAKI M
MOORE C
BRINKMAN AW
DUROSE K
TANNER BK
Citation: Td. Hallam et al., UNIFORMITY IN (HG, MN)TE FILMS GROWN BY METALORGANIC VAPOR-PHASE EPITAXY, Journal of crystal growth, 146(1-4), 1995, pp. 604-609
Authors:
BOWEN DK
TANNER BK
Citation: Dk. Bowen et Bk. Tanner, A METHOD FOR THE ACCURATE COMPARISON OF LATTICE-PARAMETERS, Journal of applied crystallography, 28, 1995, pp. 753-760
Authors:
LOXLEY N
TANNER BK
BOWEN DK
Citation: N. Loxley et al., A NOVEL BEAM-CONDITIONING MONOCHROMATOR FOR HIGH-RESOLUTION X-RAY-DIFFRACTION, Journal of applied crystallography, 28, 1995, pp. 314-317
Authors:
TANNER BK
Citation: Bk. Tanner, APPLICATION OF SYNCHROTRON X-RAY TOPOGRAPHY TO THE STUDY OF MATERIALS, Acta Physica Polonica. A, 86(4), 1994, pp. 537-544
Authors:
THOMPSON SM
TANNER BK
Citation: Sm. Thompson et Bk. Tanner, THE MAGNETIC-PROPERTIES OF SPECIALLY PREPARED PEARLITIC STEELS OF VARYING CARBON CONTENT AS A FUNCTION OF PLASTIC-DEFORMATION, Journal of magnetism and magnetic materials, 132(1-3), 1994, pp. 71-88
Authors:
SPIRKL W
TANNER BK
WHITEHOUSE C
BARNETT SJ
CULLIS AG
JOHNSON AD
KEIR A
USHER B
CLARK GF
HAGSTON W
HOGG CR
LUNN B
Citation: W. Spirkl et al., DISLOCATION CONTRAST IN X-RAY REFLECTION TOPOGRAPHY OF STRAINED HETEROSTRUCTURES, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 70(3), 1994, pp. 531-548
Authors:
SPIRKL W
TANNER BK
WHITEHOUSE C
BARNETT SJ
CULLIS AG
JOHNSON AD
KEIR A
USHER B
CLARK GE
HAGSTON W
HOGG CR
LUNN B
Citation: W. Spirkl et al., SIMULATION OF X-RAY REFLECTION TOPOGRAPHS FROM MISFIT DISLOCATIONS, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 69(1), 1994, pp. 221-236
Authors:
WESTWOOD SM
LEWIS VG
OGRADY K
TANNER BK
Citation: Sm. Westwood et al., MEASUREMENT OF INTER-PARTICLE INTERACTIONS IN A SINGLE MAGNETIC INK AGGREGATE, Journal of magnetism and magnetic materials, 125(3), 1993, pp. 120000247-120000250
Authors:
THOMPSON SM
TANNER BK
Citation: Sm. Thompson et Bk. Tanner, THE MAGNETIC-PROPERTIES OF PEARLITIC STEELS AS A FUNCTION OF CARBON CONTENT, Journal of magnetism and magnetic materials, 123(3), 1993, pp. 283-298
Authors:
BANISTER AJ
LAVENDER I
RAWSON JM
CLEGG W
TANNER BK
WHITEHEAD RJ
Citation: Aj. Banister et al., PREPARATION AND CHARACTERIZATION OF THE MIXED 1,3,2,4-DITHIADIAZOLYLIUM 1,2,3,5-DITHIADIAZOLYLIUM SALTS AND RELATED FREE-RADICALS - [M-SNSNC-C6H4-CNSSN]X AND [P-SNSNC-C6H4-CNSSN]X (X = 2+, .+ OR 2.)/, Journal of the Chemical Society. Dalton transactions, (9), 1993, pp. 1421-1429
Authors:
BARNETT SJ
WHITEHOUSE CR
KEIR AM
CLARK GF
USHER B
TANNER BK
EMENY MT
JOHNSON AD
Citation: Sj. Barnett et al., X-RAY TOPOGRAPHY OF LATTICE-RELAXATION IN STRAINED-LAYER SEMICONDUCTORS - POSTGROWTH STUDIES AND A NEW FACILITY FOR INSITU TOPOGRAPHY DURING MBE GROWTH, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 45-49
Authors:
HALFPENNY PJ
GREEN GS
TANNER BK
Citation: Pj. Halfpenny et al., X-RAY TOPOGRAPHY STUDIES OF THE DEFECT DEPTH PROFILE IN PROCESSED SILICON-WAFERS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 65-68
Authors:
COTTRELL S
SPIRKL W
TANNER BK
Citation: S. Cottrell et al., SIMULATION OF DISLOCATION IMAGES IN BRAGG-CASE DOUBLE-CRYSTAL TOPOGRAPHS OF MISFIT DISLOCATIONS IN RELAXED EPITAXIAL LAYERS OF III-V SEMICONDUCTORS, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 126-130