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Results: 4
MULTITECHNIQUE SURFACE-ANALYSIS SYSTEM - APPARATUS DESCRIPTION
Authors:
TEODORO OMND SILVA JAMC MOUTINHO AMC
Citation:
Omnd. Teodoro et al., MULTITECHNIQUE SURFACE-ANALYSIS SYSTEM - APPARATUS DESCRIPTION, Vacuum, 46(8-10), 1995, pp. 1205-1209
NEGATIVE-ION FORMATION IN PROTON-SCATTERING FROM BA AG(111)/
Authors:
VANSLOOTEN U TEODORO OMND KLEYN AW LOS J TEILLETBILLY D GAUYACQ JP
Citation:
U. Vanslooten et al., NEGATIVE-ION FORMATION IN PROTON-SCATTERING FROM BA AG(111)/, Chemical physics, 179(2), 1994, pp. 227-240
ENERGY ANALYSIS IN POSITIVE SIMS WITH CS+ BEAMS
Authors:
TEODORO OMND MANEIRA MJP MOUTINHO AMC
Citation:
Omnd. Teodoro et al., ENERGY ANALYSIS IN POSITIVE SIMS WITH CS+ BEAMS, Vacuum, 45(1), 1994, pp. 15-18
WIEN-FILTERED CS- SOURCE DESCRIPTION( BEAM FOR SIMS )
Authors:
TEODORO OMND CATARINO MIS MOUTINHO AMC
Citation:
Omnd. Teodoro et al., WIEN-FILTERED CS- SOURCE DESCRIPTION( BEAM FOR SIMS ), Applied surface science, 70-1, 1993, pp. 291-294
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