Authors: ASHIDA H TOMOTANI M TAMURA T MATSUURA K GOTO Y OTANI S

Citation: H. Ashida et al., EVALUATION OF ELECTRICAL-PROPERTIES AND SIMS PROFILES ON FORMING GAS(N-2-H-2) ANNEALED PT PZT/PT CAPACITORS/, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 97-105

Authors: SUZUKI K SUDO R TADA Y TOMOTANI M FEUDEL T FICHTNER W

Citation: K. Suzuki et al., COMPREHENSIVE ANALYTICAL EXPRESSION FOR DOSE-DEPENDENT ION-IMPLANTED IMPURITY CONCENTRATION PROFILES, Solid-state electronics, 42(9), 1998, pp. 1671-1678