Citation: M. Lanzoni et al., AUTOMATIC AND CONTINUOUS OFFSET COMPENSATION OF MOS OPERATIONAL-AMPLIFIERS USING FLOATING-GATE TRANSISTORS, IEEE journal of solid-state circuits, 33(2), 1998, pp. 287-290
Citation: B. Ricco et al., EXTRACTION OF OXIDE THICKNESS FROM HARMONIC DISTORTION OF DISPLACEMENT CURRENTS IN MOS CAPACITORS, I.E.E.E. transactions on electron devices, 44(9), 1997, pp. 1552-1554