Citation: L. Toth et al., ON THE ANALYSIS OF NOISE AND INTERFERENCE IN INSTANTANEOUSLY COMPANDING SIGNAL PROCESSORS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 45(9), 1998, pp. 1242-1249
Citation: G. Efthivoulidis et al., FURTHER RESULTS FOR NOISE IN ACTIVE RC AND MOSFET-C FILTERS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 45(9), 1998, pp. 1311-1315
Citation: A. Dec et al., NOISE-ANALYSIS OF A CLASS OF OSCILLATORS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 45(6), 1998, pp. 757-760
Citation: G. Efthivoulidis et al., NOISE IN GM-C FILTERS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 45(3), 1998, pp. 295-302
Citation: M. Yandouzi et al., HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF NANOSCALE NI-RICH NIAL FILMS EVAPORATED ONTO NACL AND KCL, Nanostructured materials, 10(1), 1998, pp. 99-115
Citation: L. Toth et S. Dadvandipour, GRAIN-SIZE EFFECT ON BRITTLE-DUCTILE TRANSITION BEHAVIOR OF MILD-STEEL, Journal of materials processing technology, 78(1-3), 1998, pp. 184-189
Authors:
JANCSO G
DOMOKI F
SANTHA P
VARGA J
FISCHER J
OROSZ K
PENKE B
BECSKEI A
DUX M
TOTH L
Citation: G. Jancso et al., BETA-AMYLOID (1-42) PEPTIDE IMPAIRS BLOOD-BRAIN-BARRIER FUNCTION AFTER INTRACAROTID INFUSION IN RATS, Neuroscience letters, 253(2), 1998, pp. 139-141
Authors:
SZUCS S
VAMOSI G
POKA R
SARVARY A
BARDOS H
BALAZS M
KAPPELMAYER J
TOTH L
SZOLLOSI J
ADANY R
Citation: S. Szucs et al., SINGLE-CELL MEASUREMENT OF SUPEROXIDE ANION AND HYDROGEN-PEROXIDE PRODUCTION BY HUMAN NEUTROPHILS WITH DIGITAL IMAGING FLUORESCENCE MICROSCOPY, Cytometry, 33(1), 1998, pp. 19-31
Citation: A. Iost et al., CORRELATION BETWEEN THE COEFFICIENT-M AND COEFFICIENT-C OF THE PARIS RELATIONSHIP, Revue de métallurgie, 95(2), 1998, pp. 229
Citation: V. Ilkovic et L. Toth, EFFECT OF INTERLAYER COUPLING IN FERROMAGNETIC ISING THIN-FILMS, Physica status solidi. a, Applied research, 165(1), 1998, pp. 255-260
Authors:
STIFTER D
HEISS W
BONANNI A
PRECHTL G
SCHMID M
HINGERL K
SEYRINGER H
SITTER H
LIU J
GORNIK E
TOTH L
BARNA A
Citation: D. Stifter et al., MOLECULAR-BEAM EPITAXY OF ZNCDSE ZNSE WIRES ON PATTERNED GAAS SUBSTRATES/, Journal of crystal growth, 185, 1998, pp. 347-351
Authors:
BONANNI A
HEISS W
PRECHTL G
STIFTER D
SCHMID M
HINGERL K
JANTSCH W
SITTER H
TOTH L
BARNA A
Citation: A. Bonanni et al., MNTE FRACTIONAL MONOLAYERS IN CDTE CDMGTE HETEROSTRUCTURES - A COMPARATIVE-STUDY OF MAGNETIC POLARONS/, Journal of crystal growth, 185, 1998, pp. 921-925
Authors:
SZUCS S
VAMOSI G
POKA R
SARVARY A
BARDOS H
BALAZS M
TOTH L
KAPPELMAYER J
SZOLLUSI J
ADANY R
Citation: S. Szucs et al., SINGLE-CELL MEASUREMENT OF GRANULOCYTE RESPIRATORY BURST WITH DIGITALIMAGING FLUORESCENCE MICROSCOPY, British Journal of Haematology, 102(1), 1998, pp. 58-58
Authors:
HEISS W
STIFTER D
PRECHTL G
BONANNI A
SITTER H
LIU J
TOTH L
BARNA A
Citation: W. Heiss et al., LATERAL CONFINEMENT IN ZNSE ZNCDSE QUANTUM-WELLS GROWN ON PATTERNED SUBSTRATES/, Applied physics letters, 72(5), 1998, pp. 575-577
Authors:
SCHRYVERS D
YANDOUZI M
HOLLANDMORITZ D
TOTH L
Citation: D. Schryvers et al., HRTEM STUDY OF AUSTENITE AND MARTENSITE IN SPLAT-COOLED AND NANOSCALETHIN-FILM NI-AL, Journal de physique. IV, 7(C5), 1997, pp. 203-208
Citation: Aj. Krasowsky et L. Toth, A THERMODYNAMIC ANALYSIS OF THE EMPIRICAL POWER RELATIONSHIPS FOR CREEP RATE AND RUPTURE TIME, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 28(9), 1997, pp. 1831-1842
Authors:
BALOGH J
BUJDOSO L
KEMENY T
PUSZTAI T
TOTH L
VINCZE I
Citation: J. Balogh et al., DIFFUSION AMORPHIZATION AND INTERFACE PROPERTIES OF FE-B MULTILAYERS, Applied physics A: Materials science & processing, 65(1), 1997, pp. 23-27
Authors:
PECZ B
DIFORTEPOISSON MA
TOTH L
RADNOCZI G
HUHN G
PAPAIOANNOU V
STOEMENOS J
Citation: B. Pecz et al., TRANSMISSION ELECTRON-MICROSCOPY CHARACTERIZATION OF METALORGANIC CHEMICAL-VAPOR-DEPOSITION GROWN GAN LAYERS, Materials science & engineering. B, Solid-state materials for advanced technology, 50(1-3), 1997, pp. 93-96