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Results: 26-33/33
Authors:
FUJITA D
SCHLEBERGER M
TOUGAARD S
Citation: D. Fujita et al., XPS STUDY OF THE SURFACE ENRICHMENT PROCESS OF CARBON ON C-DOPED NI(111) USING INELASTIC BACKGROUND ANALYSIS, Surface science, 333, 1995, pp. 343-348
Authors:
YUBERO F
JANSSON C
BATCHELOR DR
TOUGAARD S
Citation: F. Yubero et al., VALIDITY OF THE METHOD FOR QUANTITATIVE XPS OF SURFACE NANOSTRUCTURES- APPLICATION TO CU AU/CU/, Surface science, 333, 1995, pp. 753-758
Authors:
JANSSON C
TOUGAARD S
Citation: C. Jansson et S. Tougaard, QUANTITATIVE X-RAY PHOTOELECTRON-SPECTROSCOPY OF CUAU, CONI, AND CUNIALLOYS USING THEORETICAL PHOTOIONIZATION CROSS-SECTIONS OR REFERENCE SPECTRA, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2332-2336
Authors:
YUBERO F
SANZ JM
TRIGO JF
ELIZALDE E
TOUGAARD S
Citation: F. Yubero et al., QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS, Surface and interface analysis, 22(1-12), 1994, pp. 124-128
Authors:
JABLONSKI A
TOUGAARD S
Citation: A. Jablonski et S. Tougaard, DATABASE OF RELATIVISTIC ELASTIC-SCATTERING CROSS-SECTIONS FOR CALCULATIONS OF PHOTOELECTRON AND AUGER-ELECTRON TRANSPORT, Surface and interface analysis, 22(1-12), 1994, pp. 129-133
Authors:
JABLONSKI A
LESIAK B
ZOMMER L
EBEL MF
EBEL H
FUKUDA Y
SUZUKI Y
TOUGAARD S
Citation: A. Jablonski et al., QUANTITATIVE-ANALYSIS BY XPS USING THE MULTILINE APPROACH, Surface and interface analysis, 21(10), 1994, pp. 724-730
Authors:
YUBERO F
TOUGAARD S
ELIZALDE E
SANZ JM
Citation: F. Yubero et al., DIELECTRIC LOSS FUNCTION OF SI AND SIO2 FROM QUANTITATIVE-ANALYSIS OFREELS SPECTRA, Surface and interface analysis, 20(8), 1993, pp. 719-726
Authors:
TOUGAARD S
JANSSON C
Citation: S. Tougaard et C. Jansson, COMPARISON OF VALIDITY AND CONSISTENCY OF METHODS FOR QUANTITATIVE XPS PEAK ANALYSIS, Surface and interface analysis, 20(13), 1993, pp. 1013-1046