Authors: PARTRIDGE A TOUSSAINT SLG FLIPSE CFJ VANIJZENDOORN LJ VANDENOETELAAR LCA

Citation: A. Partridge et al., NANOCLUSTER FORMATION BY SPIN-COATING - QUANTITATIVE ATOMIC-FORCE MICROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY ANALYSIS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 585-592

Authors: PARTRIDGE A TOUSSAINT SLG FLIPSE CFJ

Citation: A. Partridge et al., AN AFM INVESTIGATION OF THE DEPOSITION OF NANOMETER-SIZED RHODIUM ANDCOPPER CLUSTERS BY SPIN-COATING, Applied surface science, 103(2), 1996, pp. 127-140