Authors: DIX C MCKEE PF THURLOW AR TOWERS JR WOOD DC DAWES NJ WHITNEY JT

Citation: C. Dix et al., ELECTRON-BEAM FABRICATION AND FOCUSED ION-BEAM INSPECTION OF SUBMICRON STRUCTURED DIFFRACTIVE OPTICAL-ELEMENTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3708-3711

Authors: MCKEE PF TOWERS JR WILKINSON MR WOOD D

Citation: Pf. Mckee et al., NEW APPLICATIONS OF OPTICS FROM MODERN COMPUTER DESIGN METHODS, British Telecom technology journal, 11(2), 1993, pp. 161-169