Authors:
SCHWILLE WJ
BOCKHORST M
BURBACH G
BURGWINKEL R
EMPT J
GUSE B
HAAS KM
HANNAPPEL J
HEINLOTH K
HEY T
HONSCHEID K
JAHNEN T
JAKOB HP
JOPEN N
JUNGST H
KIRCH U
KLEIN FJ
KOSTREWA D
LINDEMANN L
LINK J
MANNS J
MENZE D
MERKEL H
MERKEL R
NEUERBURG W
PAUL E
PLOTZKE R
SCHENK U
SCHMIDT S
SCHOLMANN J
SCHUTZ P
SCHULTZCOULON HC
SCHWEITZER M
TRAN MQ
VOGL W
WEDEMEYER R
WEHNES F
WISSKIRCHEN J
WOLF A
Citation: Wj. Schwille et al., DESIGN AND CONSTRUCTION OF THE SAPHIR DETECTOR, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 344(3), 1994, pp. 470-486
Citation: Dr. Whaley et al., MODE COMPETITION AND STARTUP IN CYLINDRICAL CAVITY GYROTRONS USING HIGH-ORDER OPERATING MODES, IEEE transactions on plasma science, 22(5), 1994, pp. 850-860
Citation: Tm. Antonsen et al., STUDIES OF SELF-CONSISTENT-FIELD STRUCTURE IN A QUASI-OPTICAL GYROTRON, Physics of fluids. B, Plasma physics, 5(10), 1993, pp. 3798-3807
Authors:
FIVAZ M
FASOLI A
APPERT K
SKIFF F
TRAN TM
TRAN MQ
Citation: M. Fivaz et al., STOCHASTIC PLASMA-HEATING BY ELECTROSTATIC-WAVES - A COMPARISON BETWEEN A PARTICLE-IN-CELL SIMULATION AND A LABORATORY EXPERIMENT, Physics letters. A, 182(4-6), 1993, pp. 426-432
Citation: P. Stradins et al., TEMPERATURE-DEPENDENCE OF CREATION AND ANNEALING OF LIGHT-INDUCED METASTABLE DEFECTS IN A-SI-H, Journal of non-crystalline solids, 166, 1993, pp. 175-178
Authors:
TZANETAKIS P
FRITZSCHE H
TRAN MQ
ANDROULIDAKI M
RYNES E
Citation: P. Tzanetakis et al., PHOTOCONDUCTIVITY IN COMPENSATED A-SI-H AND THE EFFECT OF BIAS LIGHT ON THE DRIFT MOBILITY, Journal of non-crystalline solids, 166, 1993, pp. 607-610
Citation: Mr. Siegrist et al., EXPERIMENTAL CONSIDERATIONS CONCERNING THE VELOCITY-MEASUREMENT OF THE RELATIVISTIC ELECTRON-BEAM IN A GYROTRON BY MEANS OF THOMSON SCATTERING, Journal of applied physics, 74(4), 1993, pp. 2229-2236
Citation: Dr. Whaley et Mq. Tran, EQUILIBRIUM AND SPACE-CHARGE WAVE ANALYSIS OF ELECTRON-BEAMS IN CONDUCTING AND ABSORBING GYROTRON BEAM TUNNELS, International journal of electronics, 74(5), 1993, pp. 771-791