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Results: 3
COMPARATIVE-STUDY OF FINITE-ELEMENT FORMULATIONS FOR THE SEMICONDUCTOR DRIFT-DIFFUSION EQUATIONS
Authors: TRATTLES JT JOHNSON CM
Citation: Jt. Trattles et Cm. Johnson, COMPARATIVE-STUDY OF FINITE-ELEMENT FORMULATIONS FOR THE SEMICONDUCTOR DRIFT-DIFFUSION EQUATIONS, International journal for numerical methods in engineering, 40(18), 1997, pp. 3405-3419
COMPUTER-SIMULATION OF ELECTROMIGRATION IN THIN-FILM METAL CONDUCTORS
Authors: TRATTLES JT ONEILL AG MECROW BC
Citation: Jt. Trattles et al., COMPUTER-SIMULATION OF ELECTROMIGRATION IN THIN-FILM METAL CONDUCTORS, Journal of applied physics, 75(12), 1994, pp. 7799-7804
3-DIMENSIONAL FINITE-ELEMENT INVESTIGATION OF CURRENT CROWDING AND PEAK TEMPERATURES IN VLSI MULTILEVEL INTERCONNECTIONS
Authors: TRATTLES JT ONEILL AG MECROW BC
Citation: Jt. Trattles et al., 3-DIMENSIONAL FINITE-ELEMENT INVESTIGATION OF CURRENT CROWDING AND PEAK TEMPERATURES IN VLSI MULTILEVEL INTERCONNECTIONS, I.E.E.E. transactions on electron devices, 40(7), 1993, pp. 1344-1347
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