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Results: 1
A STUDY OF NMOS BEHAVIOR UNDER ESD STRESS - SIMULATION AND CHARACTERIZATION
Authors:
WANG AZ TSAY C LELE A DEANE P
Citation:
Az. Wang et al., A STUDY OF NMOS BEHAVIOR UNDER ESD STRESS - SIMULATION AND CHARACTERIZATION, Microelectronics and reliability, 38(6-8), 1998, pp. 1183-1186
Risultati:
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