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Results: 3
CRACK MECHANISM IN WIRE BONDING JOINTS
Authors:
RAMMINGER S TURKES P WACHUTKA G
Citation:
S. Ramminger et al., CRACK MECHANISM IN WIRE BONDING JOINTS, Microelectronics and reliability, 38(6-8), 1998, pp. 1301-1305
ELECTROTHERMAL SIMULATION OF POWER ELECTRONIC SYSTEMS
Authors:
TURKES P SIGG J
Citation:
P. Turkes et J. Sigg, ELECTROTHERMAL SIMULATION OF POWER ELECTRONIC SYSTEMS, Microelectronics, 29(11), 1998, pp. 785-790
RELIABILITY INDICATORS FOR LIFT-OFF OF BOND WIRES IN IGBT POWER-MODULES
Authors:
FAROKHZAD B TURKES P WOLFGANG E GOSER K
Citation:
B. Farokhzad et al., RELIABILITY INDICATORS FOR LIFT-OFF OF BOND WIRES IN IGBT POWER-MODULES, Microelectronics and reliability, 36(11-12), 1996, pp. 1863-1866
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