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Results: 1-9 |
Results: 9
Indium surface segregation during growth of (In,Ga)N/GaN multiple quantum wells by plasma-assisted molecular beam epitaxy
Authors: Waltereit, P Brandt, O Ploog, KH Tagliente, MA Tapfer, L
Citation: P. Waltereit et al., Indium surface segregation during growth of (In,Ga)N/GaN multiple quantum wells by plasma-assisted molecular beam epitaxy, PHYS ST S-B, 228(1), 2001, pp. 49-53
On the influence of carbon implantation on the structural properties of hard TiN coatings studied by glancing incidence X-ray diffraction
Authors: Tagliente, MA Falcone, R Mello, D Esposito, C Tapfer, L
Citation: Ma. Tagliente et al., On the influence of carbon implantation on the structural properties of hard TiN coatings studied by glancing incidence X-ray diffraction, NUCL INST B, 179(1), 2001, pp. 42-54
Structural and optical properties of silver thin films deposited by RF magnetron sputtering
Authors: Rizzo, A Tagliente, MA Alvisi, M Scaglione, S
Citation: A. Rizzo et al., Structural and optical properties of silver thin films deposited by RF magnetron sputtering, THIN SOL FI, 396(1-2), 2001, pp. 29-35
The influence of the momentum transfer on the structural and optical properties of ZnSe thin films prepared by r.f. magnetron sputtering
Authors: Rizzo, A Tagliente, MA Caneve, L Scaglione, S
Citation: A. Rizzo et al., The influence of the momentum transfer on the structural and optical properties of ZnSe thin films prepared by r.f. magnetron sputtering, THIN SOL FI, 368(1), 2000, pp. 8-14
X-ray characterization of LiNbO3 films grown by pulsed laser deposition onSrTiO3(100), NdGaO3(110) and MgO(111) substrates
Authors: Tagliente, MA De Caro, L Sacchetti, A Tapfer, L Balestrino, G Medaglia, PG Tebano, A Tucciarone, A
Citation: Ma. Tagliente et al., X-ray characterization of LiNbO3 films grown by pulsed laser deposition onSrTiO3(100), NdGaO3(110) and MgO(111) substrates, J CRYST GR, 216(1-4), 2000, pp. 335-342
Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers
Authors: Gerardi, C Tagliente, MA Del Vecchio, A Tapfer, L Coccorese, C Attanasio, C Mercaldo, LV Maritato, L Slaughter, JM Falco, CM
Citation: C. Gerardi et al., Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers, J APPL PHYS, 87(2), 2000, pp. 717-723
Characterisation of ZnS : Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patterns
Authors: Tagliente, MA Penza, M Gusso, M Quirini, A
Citation: Ma. Tagliente et al., Characterisation of ZnS : Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patterns, THIN SOL FI, 353(1-2), 1999, pp. 129-136
Characterization of transparent and conductive electrodes of indium tin oxide thin films by sequential reactive evaporation
Authors: Penza, M Cozzi, S Tagliente, MA Mirenghi, L Martucci, C Quirini, A
Citation: M. Penza et al., Characterization of transparent and conductive electrodes of indium tin oxide thin films by sequential reactive evaporation, THIN SOL FI, 349(1-2), 1999, pp. 71-77
High quality ZnS : Mn thin films grown by quasi-rheotaxy for electroluminescent devices
Authors: Romeo, N Cozzi, S Tedeschi, R Bosio, A Canevari, V Tagliente, MA Penza, M
Citation: N. Romeo et al., High quality ZnS : Mn thin films grown by quasi-rheotaxy for electroluminescent devices, THIN SOL FI, 348(1-2), 1999, pp. 49-55
Risultati: 1-9 |