AAAAAA
Results:
1-3
|
Results: 3
Authors:
Rey-Tauriac, Y
Taurin, M
Bonnaud, O
Citation: Y. Rey-tauriac et al., Wafer level accelerated test for ionic contamination control on VDMOS transistors in bipolar/CMOS/DMOS, MICROEL REL, 41(9-10), 2001, pp. 1331-1334
Authors:
Rey-Tauriac, Y
Taurin, M
Bonnaud, O
Citation: Y. Rey-tauriac et al., High reliability power VDMOS transistors in bipolar/CMOS/DMOS technology, MICROEL REL, 41(9-10), 2001, pp. 1707-1712
Authors:
Gagnard, X
Taurin, M
Bonnaud, O
Citation: X. Gagnard et al., New rapid method for lifetime determination of gate oxide validated with Bipolar/CMOS/DMOS technology, MICROEL REL, 39(6-7), 1999, pp. 759-763
Risultati:
1-3
|