AAAAAA
Results: 1-25/29
Authors:
Wang, SH
Tay, CJ
Quan, C
Shang, HM
Citation: Sh. Wang et al., Determination of deflection and Young's modulus of a micro-beam by means of interferometry, MEAS SCI T, 12(8), 2001, pp. 1279-1286
Authors:
Tay, CJ
Quan, C
Wang, SH
Shang, HM
Chan, KC
Citation: Cj. Tay et al., Measurement of a microphone membrane deflection profile using an optical fibre and wedge fringe projection, MEAS SCI T, 12(3), 2001, pp. 320-326
Authors:
Quan, C
Tay, CJ
Shang, HM
Citation: C. Quan et al., The use of carrier fringes and FFT in holographic nondestructive testing, EXP TECH, 25(4), 2001, pp. 35-38
Authors:
Shang, HM
Toh, SL
Fu, Y
Quan, C
Tay, CJ
Citation: Hm. Shang et al., The use of circular optical grating for measuring angular rotation of mirrors, OPT LASER E, 36(5), 2001, pp. 487-500
Authors:
Wang, SH
Jin, CJ
Tay, CJ
Quan, C
Shang, HM
Citation: Sh. Wang et al., Design of an optical probe for testing surface roughness and micro-displacement, PRECIS ENG, 25(4), 2001, pp. 258-265
Authors:
Tay, CJ
He, XY
Kang, X
Quan, C
Shang, HM
Citation: Cj. Tay et al., Coplanarity study on ball grid array packaging, OPT ENG, 40(8), 2001, pp. 1608-1612
Authors:
Quan, C
Tay, CJ
Wang, SH
Shang, HM
Chan, KC
Citation: C. Quan et al., Study on deformation of a microphone membrane using multiple-wavelength interferometry, OPT COMMUN, 197(4-6), 2001, pp. 279-287
Authors:
Tay, CJ
Quan, C
Wang, SH
Shang, HM
Citation: Cj. Tay et al., Determination of a micromirror angular rotation using laser interferometric method, OPT COMMUN, 195(1-4), 2001, pp. 71-77
Authors:
He, XY
Xia, J
Quan, C
Tay, CJ
Tu, SD
Citation: Xy. He et al., Creep deformation measurement using quartz optical fiber, OPT COMMUN, 190(1-6), 2001, pp. 79-86
Authors:
Quan, C
He, XY
Wang, CF
Tay, CJ
Shang, HM
Citation: C. Quan et al., Shape measurement of small objects using LCD fringe projection with phase shifting, OPT COMMUN, 189(1-3), 2001, pp. 21-29
Authors:
Toh, SL
Quan, C
Woo, KC
Tay, CJ
Shang, HM
Citation: Sl. Toh et al., Whole field surface roughness measurement by laser speckle correlation technique, OPT LASER T, 33(6), 2001, pp. 427-434
Authors:
Shang, HM
Hung, MYY
Quan, CG
Tay, CJ
Citation: Hm. Shang et al., Beam-splitting cube for fringe-projection, holographic, and shearographic interferometry, APPL OPTICS, 40(31), 2001, pp. 5615-5623
Authors:
Wang, SH
Tay, CJ
Quan, C
Shang, HM
Zhou, ZF
Citation: Sh. Wang et al., Laser integrated measurement of surface roughness and micro-displacement, MEAS SCI T, 11(5), 2000, pp. 454-458
Authors:
Toh, SL
Tay, CJ
Ng, SH
Rahman, M
Citation: Sl. Toh et al., AlxGa1-xAs semiconductor sensor for contact pressure measurement, SENS ACTU-A, 79(1), 2000, pp. 31-35
Authors:
Wang, SH
Tay, CJ
Quan, C
Shang, HM
Citation: Sh. Wang et al., Collimating of diverging laser diode beam using graded-index optical fiber, OPT LASER E, 34(2), 2000, pp. 121-127
Authors:
Wang, SH
Quan, CG
Tay, CJ
Shang, HM
Citation: Sh. Wang et al., Surface roughness measurement in the submicrometer range using laser scattering, OPT ENG, 39(6), 2000, pp. 1597-1601
Authors:
Wang, SH
Tay, CJ
Quan, CG
Shang, HM
Citation: Sh. Wang et al., An optical fiber fringe projector for micro-component, OPTIK, 111(9), 2000, pp. 419-422
Authors:
Tay, CJ
Shang, HM
Quan, C
Citation: Cj. Tay et al., Defects detection of plates using comparative digital speckle pattern interferometry, OPTIK, 111(12), 2000, pp. 536-540
Authors:
Quan, C
Wang, SH
Tay, CJ
Shang, HM
Chan, KC
Citation: C. Quan et al., Inspection of micro-cracks on solderball surface using a laser scattering method, OPT COMMUN, 183(1-4), 2000, pp. 19-27
Authors:
Tay, CJ
Wang, SH
Quan, C
Shang, HM
Citation: Cj. Tay et al., Optical measurement of Young's modulus of a micro-beam, OPT LASER T, 32(5), 2000, pp. 329-333
Authors:
Shang, HM
Quan, C
Tay, CJ
Hung, YY
Citation: Hm. Shang et al., Generation of carrier fringes in holography and shearography, APPL OPTICS, 39(16), 2000, pp. 2638-2645
Authors:
Quan, C
Tay, CJ
Shang, HM
Citation: C. Quan et al., Fringe projection technique for the 3-D shape measurement of a hydroformedshell, J MATER PR, 90, 1999, pp. 88-91
Authors:
Sirohi, RS
Tay, CJ
Shang, HM
Boo, WP
Citation: Rs. Sirohi et al., Nondestructive assessment of thinning of plates using digital shearography, OPT ENG, 38(9), 1999, pp. 1582-1585
Authors:
He, YM
Tay, CJ
Shang, HM
Citation: Ym. He et al., Digital phase-shifting shearography for slope measurement, OPT ENG, 38(9), 1999, pp. 1586-1590
Authors:
He, YM
Tay, CJ
Shang, HM
Citation: Ym. He et al., A new method for phase analysis in speckle shearing interferometer, OPTIK, 110(8), 1999, pp. 389-393