Authors:
Heyns, MM
Bearda, T
Cornelissen, I
De Gendt, S
Degraeve, R
Groeseneken, G
Kenens, C
Knotter, DM
Loewenstein, LM
Mertens, PW
Mertens, S
Meuris, M
Nigam, T
Schaekers, M
Teerlinck, I
Vandervorst, W
Vos, R
Wolke, K
Citation: Mm. Heyns et al., Cost-effective cleaning and high-quality thin gate oxides, IBM J RES, 43(3), 1999, pp. 339-350