Authors:
Abouraddy, AF
Saleh, BEA
Sergienko, AV
Teich, MC
Citation: Af. Abouraddy et al., Double-slit interference of biphotons generated in spontaneous parametric downconversion from a thick crystal, J OPT B-QUA, 3(1), 2001, pp. S50-S54
Authors:
Abouraddy, AF
Nasr, MB
Saleh, BEA
Sergienko, AV
Teich, MC
Citation: Af. Abouraddy et al., Demonstration of the complementarity of one- and two-photon interference -art. no. 063803, PHYS REV A, 6306(6), 2001, pp. 3803
Authors:
Lowen, SB
Ozaki, T
Kaplan, E
Saleh, BEA
Teich, MC
Citation: Sb. Lowen et al., Fractal features of dark, maintained, and driven neural discharges in the cat visual system, METHODS, 24(4), 2001, pp. 377-394
Authors:
Abouraddy, AF
Toussaint, KC
Sergienko, AV
Saleh, BEA
Teich, MC
Citation: Af. Abouraddy et al., Ellipsometric measurements by use of photon pairs generated by spontaneousparametric downconversion, OPTICS LETT, 26(21), 2001, pp. 1717-1719
Authors:
Tsegaye, T
Soderholm, J
Atature, M
Trifonov, A
Bjork, G
Sergienko, AV
Saleh, BEA
Teich, MC
Citation: T. Tsegaye et al., Experimental demonstration of three mutually orthogonal polarization states of entangled photons, PHYS REV L, 85(24), 2000, pp. 5013-5017
Authors:
Atature, M
Sergienko, AV
Saleh, BEA
Teich, MC
Citation: M. Atature et al., Dispersion-independent high-visibility quantum interference in ultrafast parametric down-conversion, PHYS REV L, 84(4), 2000, pp. 618-621
Citation: Ma. Saleh et al., Dead-space-based theory correctly predicts excess noise factor for thin GaAs and AlGaAs avalanche photodiodes, IEEE DEVICE, 47(3), 2000, pp. 625-633
Authors:
Atature, M
Sergienko, AV
Jost, BM
Saleh, BEA
Teich, MC
Citation: M. Atature et al., Partial distinguishability in femtosecond optical spontaneous parametric down-conversion, PHYS REV L, 83(7), 1999, pp. 1323-1326
Authors:
Thurner, S
Feurstein, MC
Lowen, SB
Teich, MC
Citation: S. Thurner et al., Receiver-operating-characteristic analysis reveals superiority of scale-dependent wavelet and spectral measures for assessing cardiac dysfunction, PHYS REV L, 81(25), 1998, pp. 5688-5691