Authors: Piccoz, D Teste, P Andlauer, R Leblanc, T Chabrerie, JP

Citation: D. Piccoz et al., The repulsion of electrical contacts crossed by short-circuit currents, EPJ-APPL PH, 13(1), 2001, pp. 59-65

Authors: Gaugue, A Teste, P Delerue, J Gensbittel, A De Luca, A Kreisler, A Voisin, F Klisnick, G Redon, M

Citation: A. Gaugue et al., YBaCuO mid-infrared bolometers: Substrate influence on inter-pixel crosstalk, IEEE APPL S, 11(1), 2001, pp. 766-769

Authors: Teste, P Leblanc, T Andlauer, R Chabrerie, JP

Citation: P. Teste et al., Copper cathode erosion by an electric arc - the causes of the variations of the erosion rate with the electrode gap, PLASMA SOUR, 10(1), 2001, pp. 10-16

Authors: Teste, P Leblanc, T Uhlig, F Chabrerie, JP

Citation: P. Teste et al., 3D modeling of the heating of a metal sheet by a moving arc: application to aircraft lightning protection, EPJ-APPL PH, 11(3), 2000, pp. 197-204

Authors: Gouega, AM Teste, P Andlauer, R Leblanc, T Chabrerie, JP

Citation: Am. Gouega et al., Study of the electrode gap influence on electrode erosion under the actionof an electric arc, EPJ-APPL PH, 11(2), 2000, pp. 111-122