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Citation: As. Thanawalla et al., Frequency following imaging of electric fields from resonant superconducting devices using a scanning near-field microwave microscope, IEEE APPL S, 9(2), 1999, pp. 3042-3045

Authors: Anlage, SM Steinhauer, DE Vlahacos, CP Feenstra, BJ Thanawalla, AS Hu, WS Dutta, SK Wellstood, FC

Citation: Sm. Anlage et al., Superconducting material diagnostics using a scanning near-field microwavemicroscope, IEEE APPL S, 9(2), 1999, pp. 4127-4132

Authors: Dutta, SK Vlahacos, CP Steinhauer, DE Thanawalla, AS Feenstra, BJ Wellstood, FC Anlage, SM Newman, HS

Citation: Sk. Dutta et al., Imaging microwave electric fields using a near-field scanning microwave microscope, APPL PHYS L, 74(1), 1999, pp. 156-158