Authors: Thomas, PJS Hosea, TJC Lancefield, D Meidia, H

Citation: Pjs. Thomas et al., Monitoring thickness changes in GaAs/AlAs partial VCSEL Bragg reflector stacks using optical spectroscopic, x-ray and electron microscopic methods, SEMIC SCI T, 16(2), 2001, pp. 107-117

Authors: Sale, TE Hosea, TJC Thomas, PJS

Citation: Te. Sale et al., Photomodulated reflectance as a valuable nondestructive process tool for VCSELs, IEEE PHOTON, 12(10), 2000, pp. 1328-1330

Authors: Vicente, PMA Thomas, PJS Lancefield, D Sale, TE Hosea, TJC Adams, AR Klar, PJ Raymond, A

Citation: Pma. Vicente et al., Quantum-well and cavity-mode resonance effects in a vertical-cavity surface-emitting laser structure, observed by photoreflectance using hydrostatic pressure and temperature tuning, PHYS ST S-B, 211(1), 1999, pp. 255-262

Authors: Klar, PJ Rowland, G Thomas, PJS Onischenko, A Sale, TE Hosea, TJC Grey, R

Citation: Pj. Klar et al., Photomodulated reflectance study of InxGa1-xAs/GaAs/AlAs microcavity vertical-cavity surface emitting laser structures in the weak-coupling regime: The cavity/ground-state-exciton resonance, PHYS REV B, 59(4), 1999, pp. 2894-2901

Authors: Klar, PJ Rowland, G Thomas, PJS Onischenko, A Sale, TE Hosea, TJC Grey, R

Citation: Pj. Klar et al., Photomodulated reflectance of InxGa1-xAs/GaAs/AlAs microcavity vertical-cavity surface emitting laser structures: Monitoring higher-order quantum well transitions, PHYS REV B, 59(4), 1999, pp. 2902-2909