Authors: Hecker, M Tietjen, D Elefant, D Schneider, CM Qiu, A Cramer, N Camley, RE Celinski, Z

Citation: M. Hecker et al., Thermally activated deterioration processes in Co/Cu GMR multilayers, J APPL PHYS, 89(11), 2001, pp. 7113-7115

Authors: Elefant, D Tietjen, D van Loyen, L Moench, I Schneider, CM

Citation: D. Elefant et al., Dominant role of the size effect for saturation resistivity and giant magnetoresistance in Co/Cu multilayers, J APPL PHYS, 89(11), 2001, pp. 7118-7120

Authors: Hecker, M Tietjen, D Prokert, F Schell, N Schneider, CM

Citation: M. Hecker et al., Investigation of Co/Cu/NiFe-multilayers by X-ray reflectometry and diffraction, MIKROCH ACT, 133(1-4), 2000, pp. 239-241

Authors: van Loyen, L Elefant, D Tietjen, D Schneider, CM Hecker, M Thomas, J

Citation: L. Van Loyen et al., Annealing of Ni80Fe20/Cu and Co/Cu multilayers, J APPL PHYS, 87(9), 2000, pp. 4852-4854