Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-1
|
Results: 1
Performance and reliability improvement of low-power embedded flash memorywith shallow trench isolation structure
Authors:
Huang, HS Su, J Lee, DL Lin, CH Ting, WC Hong, G
Citation:
Hs. Huang et al., Performance and reliability improvement of low-power embedded flash memorywith shallow trench isolation structure, JPN J A P 1, 40(2A), 2001, pp. 551-556
Risultati:
1-1
|