Authors: Ho, YW Ng, V Choi, WK Ng, SP Osipowicz, T Seng, HL Tjui, WW Li, K

Citation: Yw. Ho et al., Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using Raman spectroscopy, RBS and TEM, SCR MATER, 44(8-9), 2001, pp. 1291-1295