Authors: Vieira, MT Ramos, AS Trindade, B Fernandes, JV Vieira, MF

Citation: Mt. Vieira et al., An approach using thin films as a predictive way to produce new bulk materials, SURF COAT, 131(1-3), 2000, pp. 162-166

Authors: Coelho, C Ramos, AS Trindade, B Vieira, MT Fernandes, JV Vieira, M

Citation: C. Coelho et al., Structure and properties of sputtered TiAl-M (M = Ag, Cr) thin films, SURF COAT, 121, 1999, pp. 297-302

Authors: Cavaleiro, A Trindade, B Vieira, MT

Citation: A. Cavaleiro et al., Deposition and characterization of fine-grained W-Ni-C/N ternary films, SURF COAT, 119, 1999, pp. 944-948

Authors: Vieira, MT Trindade, B Ramos, AS Fernandes, JV Vieira, MF

Citation: Mt. Vieira et al., The influence of silver on the structure and mechanical properties of (TiAl)-based intermetallics, THIN SOL FI, 344, 1999, pp. 43-46