Authors: Blinov, AV Kanakov, AG Trusov, VA Yurkov, NK

Citation: Av. Blinov et al., Acceptance checking methods for UHF electronic components, MEAS TECH R, 43(10), 2000, pp. 895-901

Authors: Yurkov, NK Trusov, VA

Citation: Nk. Yurkov et Va. Trusov, The dependence of the profile of a titanium substrate on the composition of the dielectric coating, MEAS TECH R, 42(9), 1999, pp. 853-857