Authors:
Paskova, T
Valcheva, E
Birch, J
Tungasmita, S
Persson, POA
Paskov, PP
Evtimova, S
Abrashev, M
Monemar, B
Citation: T. Paskova et al., Defect and stress relaxation in HVPE-GaN films using high temperature reactively sputtered AlN buffer, J CRYST GR, 230(3-4), 2001, pp. 381-386
Authors:
Paskova, T
Valcheva, E
Birch, J
Tungasmita, S
Persson, POA
Beccard, R
Heuken, M
Monemar, B
Citation: T. Paskova et al., Effect of Si doping of metalorganic chemical vapor deposition-GaN templates on the defect arrangement in hydride vapor phase epitaxy-GaN overgrown layers, J APPL PHYS, 88(10), 2000, pp. 5729-5732
Authors:
Tungasmita, S
Birch, J
Persson, POA
Jarrendahl, K
Hultman, L
Citation: S. Tungasmita et al., Enhanced quality of epitaxial AlN thin films on 6H-SiC by ultra-high-vacuum ion-assisted reactive dc magnetron sputter deposition, APPL PHYS L, 76(2), 2000, pp. 170-172
Authors:
Valcheva, E
Paskova, T
Tungasmita, S
Persson, POA
Birch, J
Svedberg, EB
Hultman, L
Monemar, B
Citation: E. Valcheva et al., Interface structure of hydride vapor phase epitaxial GaN grown with high-temperature reactively sputtered AlN buffer, APPL PHYS L, 76(14), 2000, pp. 1860-1862
Authors:
Paskova, T
Birch, J
Tungasmita, S
Beccard, R
Heuken, M
Svedberg, EB
Runesson, P
Goldys, EM
Monemar, B
Citation: T. Paskova et al., Thick hydride vapour phase epitaxial GaN layers grown on sapphire with different buffers, PHYS ST S-A, 176(1), 1999, pp. 415-419