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Authors: Schulze, HJ Frohnmeyer, A Niedernostheide, FJ Hille, F Tutto, P Pavelka, T Wachutka, G
Citation: Hj. Schulze et al., Carrier lifetime analysis by photoconductance decay and free carrier absorption measurements, J ELCHEM SO, 148(11), 2001, pp. G655-G661

Authors: Schulze, HJ Frohnmeyer, A Niedernostheide, FJ Simmnacher, B Kolbesen, BO Tutto, P Pavelka, T Wachutka, G
Citation: Hj. Schulze et al., Analytical tools for the characterization of power devices, J ELCHEM SO, 147(10), 2000, pp. 3879-3888
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